电子显微镜的物理原理:介绍TEM, SEM和AEM

{"title":"电子显微镜的物理原理:介绍TEM, SEM和AEM","authors":"R. Egerton","doi":"10.1007/978-3-319-39877-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":422261,"journal":{"name":"Physical Principles of Electron Microscopy","volume":"373 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"668","resultStr":"{\"title\":\"Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM\",\"authors\":\"R. Egerton\",\"doi\":\"10.1007/978-3-319-39877-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":422261,\"journal\":{\"name\":\"Physical Principles of Electron Microscopy\",\"volume\":\"373 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"668\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physical Principles of Electron Microscopy\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-319-39877-8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physical Principles of Electron Microscopy","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-39877-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}