低能量砷注入诱导量子阱混叠无序的InGaAs/InGaAsP激光光子集成

H.S. Lim, B. Ooi, Y. Lam, Y. Chan, V. Aimez, J. Beauvais, J. Beerens
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引用次数: 1

摘要

利用中性杂质诱导无序的量子阱混合技术(QWI)在光子集成电路(PICs)生产中具有重要意义。我们报道了一种使用低能量砷注入诱导无序技术的高选择性QWI过程。由于已知来自杂质的自由电子会导致高光学吸收并在混合后降低材料的质量,因此选择了InGaAs/InGaAsP体系中的电中性物质砷来进行工艺开发。相对较低的注入能量(360 keV)减少了损伤的产生,并使注入深度较浅,远离活性区域。在200/spl度/C的温度下,通过改变注入砷的剂量,成功地制备出了混合量可控的蓝移量子阱激光材料。据报道,差分带隙位移可达60mev。扩展腔激光器和单片多波长激光源等pic目前正在使用该技术进行研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Photonic integration of InGaAs/InGaAsP laser using low energy arsenic implantation induced disordering for quantum well intermixing
Quantum well intermixing (QWI) using a neutral impurity induced disordering technique is of great interest in producing photonic integrated circuits (PICs). We report a high selectivity QWI process using a low energy arsenic implantation induced disordering technique. Since it is known that free electrons from impurities result in high optical absorption and degrade the quality of the material after intermixing, arsenic, an electrically neutral species in the InGaAs/InGaAsP system, was chosen for the process development. The relatively low implantation energy, 360 keV, reduces the damage generation and results in a shallow implantation depth far away from the active region. We have successfully blue shifted quantum well laser material with a control on the amount of intermixing by varying the dose of As implantation at 200/spl deg/C. A wide range of differential bandgap shifts going up to 60 meV are reported. PICs such as extended cavity lasers and monolithic multiple wavelength laser sources are currently being investigated using this technique.
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