高压偏转管测试的新方法

H. Wittlinger, J. Dean
{"title":"高压偏转管测试的新方法","authors":"H. Wittlinger, J. Dean","doi":"10.1109/TBTR2.1962.4503191","DOIUrl":null,"url":null,"abstract":"Techniques which are generally applicable to high-voltage deflection tubes are discussed in this paper, with specific application to television horizontal-deflection amplifiers. In an entirely new approach to testing horizontal-deflection amplifiers, the tubes are tested in circuits that closely simulate actual operating conditions. Six separate tests have been replaced by a single test. Carefully controlled test conditions and the development of several unique detectors for these tests have resulted in repeatable and reproducible results. Although the circuits have become more complex as a result of simplifying the testing procedures, cost of over-all testing has been reduced and product quality has been improved.","PeriodicalId":136909,"journal":{"name":"Ire Transactions on Broadcast and Television Receivers","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1962-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A New Approach to Testing High-Voltage Deflection Tubes\",\"authors\":\"H. Wittlinger, J. Dean\",\"doi\":\"10.1109/TBTR2.1962.4503191\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Techniques which are generally applicable to high-voltage deflection tubes are discussed in this paper, with specific application to television horizontal-deflection amplifiers. In an entirely new approach to testing horizontal-deflection amplifiers, the tubes are tested in circuits that closely simulate actual operating conditions. Six separate tests have been replaced by a single test. Carefully controlled test conditions and the development of several unique detectors for these tests have resulted in repeatable and reproducible results. Although the circuits have become more complex as a result of simplifying the testing procedures, cost of over-all testing has been reduced and product quality has been improved.\",\"PeriodicalId\":136909,\"journal\":{\"name\":\"Ire Transactions on Broadcast and Television Receivers\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1962-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Ire Transactions on Broadcast and Television Receivers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TBTR2.1962.4503191\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Ire Transactions on Broadcast and Television Receivers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TBTR2.1962.4503191","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文讨论了一般适用于高压偏转管的技术,并具体应用于电视水平偏转放大器。在一种全新的测试水平偏转放大器的方法中,这些管在模拟实际操作条件的电路中进行测试。六个独立的测试被一个单独的测试取代。仔细控制的测试条件和为这些测试开发的几种独特的检测器已经产生了可重复和可重复的结果。虽然由于简化了测试程序,电路变得更加复杂,但总体测试的成本已经降低,产品质量也得到了提高。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A New Approach to Testing High-Voltage Deflection Tubes
Techniques which are generally applicable to high-voltage deflection tubes are discussed in this paper, with specific application to television horizontal-deflection amplifiers. In an entirely new approach to testing horizontal-deflection amplifiers, the tubes are tested in circuits that closely simulate actual operating conditions. Six separate tests have been replaced by a single test. Carefully controlled test conditions and the development of several unique detectors for these tests have resulted in repeatable and reproducible results. Although the circuits have become more complex as a result of simplifying the testing procedures, cost of over-all testing has been reduced and product quality has been improved.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信