{"title":"圆形微屏蔽线场模式的研究","authors":"Hai Sun","doi":"10.1109/CIS.2017.00144","DOIUrl":null,"url":null,"abstract":"The edge-based finite element method is employed to analyze the field patterns in two types of circular-shaped microshield lines, which include circular-shaped microshield line with single signal line and dual signal lines. Field patterns of the dominant mode and the first higher-order mode for different dimensions and the dielectric constant of dielectric substrate are illustrated. The figures in this article are considered helpful in practical applications.","PeriodicalId":304958,"journal":{"name":"2017 13th International Conference on Computational Intelligence and Security (CIS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Research on Field Patterns in Circular-Shaped Microshield Lines\",\"authors\":\"Hai Sun\",\"doi\":\"10.1109/CIS.2017.00144\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The edge-based finite element method is employed to analyze the field patterns in two types of circular-shaped microshield lines, which include circular-shaped microshield line with single signal line and dual signal lines. Field patterns of the dominant mode and the first higher-order mode for different dimensions and the dielectric constant of dielectric substrate are illustrated. The figures in this article are considered helpful in practical applications.\",\"PeriodicalId\":304958,\"journal\":{\"name\":\"2017 13th International Conference on Computational Intelligence and Security (CIS)\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 13th International Conference on Computational Intelligence and Security (CIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CIS.2017.00144\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 13th International Conference on Computational Intelligence and Security (CIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CIS.2017.00144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research on Field Patterns in Circular-Shaped Microshield Lines
The edge-based finite element method is employed to analyze the field patterns in two types of circular-shaped microshield lines, which include circular-shaped microshield line with single signal line and dual signal lines. Field patterns of the dominant mode and the first higher-order mode for different dimensions and the dielectric constant of dielectric substrate are illustrated. The figures in this article are considered helpful in practical applications.