V. Starostenko, Ya.V. Grygoriev, A. V. Rukavishnikov, Y. Taran
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Numeric computation of proofness of inhomogeneous microstructure elements at the influence of power electromagnetic field [IC degradation]
A procedure for the numerical calculation of the development of degradation processes in microstructure elements of integrated circuits by the action of electromagnetic fields is presented. The influence of conductive microstructure inhomogeneity parameters upon a threshold value of the electric intensity of an impinging electromagnetic wave is detected.