{"title":"精密光电相位噪声测量不确定度的现代估计方法","authors":"P. Salzenstein, E. Pavlyuchenko","doi":"10.1109/CAOL.2013.6657629","DOIUrl":null,"url":null,"abstract":"Modern approach according to recent standards is used to determine uncertainty on phase noise for an optoelectronic measurement system. Deduced global uncertainty on the spectral density of phase noise is 1.6 dB.","PeriodicalId":189618,"journal":{"name":"2013 International Conference on Advanced Optoelectronics and Lasers (CAOL 2013)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Modern approach for estimating uncertainty of a precision optoelectronic phase noise measurement\",\"authors\":\"P. Salzenstein, E. Pavlyuchenko\",\"doi\":\"10.1109/CAOL.2013.6657629\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Modern approach according to recent standards is used to determine uncertainty on phase noise for an optoelectronic measurement system. Deduced global uncertainty on the spectral density of phase noise is 1.6 dB.\",\"PeriodicalId\":189618,\"journal\":{\"name\":\"2013 International Conference on Advanced Optoelectronics and Lasers (CAOL 2013)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Advanced Optoelectronics and Lasers (CAOL 2013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CAOL.2013.6657629\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Advanced Optoelectronics and Lasers (CAOL 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CAOL.2013.6657629","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modern approach for estimating uncertainty of a precision optoelectronic phase noise measurement
Modern approach according to recent standards is used to determine uncertainty on phase noise for an optoelectronic measurement system. Deduced global uncertainty on the spectral density of phase noise is 1.6 dB.