求解电磁兼容问题的电物理过程的物理和数学建模

2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS) Pub Date : 2020-09-07 DOI:10.1109/IEPS51250.2020.9263133

M. Rezinkina, O. Rezinkin, S. Buryakovskiy

{"title":"求解电磁兼容问题的电物理过程的物理和数学建模","authors":"M. Rezinkina, O. Rezinkin, S. Buryakovskiy","doi":"10.1109/IEPS51250.2020.9263133","DOIUrl":null,"url":null,"abstract":"Mathematical modeling of the processes at the electromagnetic fields (EMF) of natural and artificial origin application to sensitive electronic equipment has been carried out. Test installations for full-scale physical modeling of the EMF impulses impacts on sensitive electronic equipment, aviation technique, etc. or their critical parts have been elaborated.","PeriodicalId":235261,"journal":{"name":"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Physical and Mathematical Modelling of Electrophysical Processes for Solution of Electromagnetic Compatibility Problems\",\"authors\":\"M. Rezinkina, O. Rezinkin, S. Buryakovskiy\",\"doi\":\"10.1109/IEPS51250.2020.9263133\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mathematical modeling of the processes at the electromagnetic fields (EMF) of natural and artificial origin application to sensitive electronic equipment has been carried out. Test installations for full-scale physical modeling of the EMF impulses impacts on sensitive electronic equipment, aviation technique, etc. or their critical parts have been elaborated.\",\"PeriodicalId\":235261,\"journal\":{\"name\":\"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)\",\"volume\":\"44 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEPS51250.2020.9263133\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEPS51250.2020.9263133","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

对应用于敏感电子设备的天然和人工电磁场过程进行了数学建模。对电动势脉冲对敏感电子设备、航空技术等或其关键部件的影响进行全尺寸物理建模的测试装置已经详细阐述。

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Physical and Mathematical Modelling of Electrophysical Processes for Solution of Electromagnetic Compatibility Problems

Mathematical modeling of the processes at the electromagnetic fields (EMF) of natural and artificial origin application to sensitive electronic equipment has been carried out. Test installations for full-scale physical modeling of the EMF impulses impacts on sensitive electronic equipment, aviation technique, etc. or their critical parts have been elaborated.

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来源期刊

2020 IEEE 4th International Conference on Intelligent Energy and Power Systems (IEPS)

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