{"title":"行波技术在馈线电路保护中的应用:——多相/多回路系统","authors":"P. McLaren, S. Rajendra","doi":"10.1109/TPAS.1985.318909","DOIUrl":null,"url":null,"abstract":"In a preceding paper [1], the authors had described new techniques based on the h.f. travelling-wave information contained in the post fault voltage and current signals. In an attempt to present the underlying principles without undue complications, the study was limited to a lossless, frequency independent single phase line model.","PeriodicalId":227345,"journal":{"name":"IEEE Transactions on Power Apparatus and Systems","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"40","resultStr":"{\"title\":\"Travelling-Wave Techniques Applied to the Protection of Teed Circuits:- Multi-Phase/Multi-circuit Sytstem\",\"authors\":\"P. McLaren, S. Rajendra\",\"doi\":\"10.1109/TPAS.1985.318909\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In a preceding paper [1], the authors had described new techniques based on the h.f. travelling-wave information contained in the post fault voltage and current signals. In an attempt to present the underlying principles without undue complications, the study was limited to a lossless, frequency independent single phase line model.\",\"PeriodicalId\":227345,\"journal\":{\"name\":\"IEEE Transactions on Power Apparatus and Systems\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"40\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Power Apparatus and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TPAS.1985.318909\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Power Apparatus and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TPAS.1985.318909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Travelling-Wave Techniques Applied to the Protection of Teed Circuits:- Multi-Phase/Multi-circuit Sytstem
In a preceding paper [1], the authors had described new techniques based on the h.f. travelling-wave information contained in the post fault voltage and current signals. In an attempt to present the underlying principles without undue complications, the study was limited to a lossless, frequency independent single phase line model.