基于时间逻辑的延迟故障可测试性建模

G. Westerman, J. Heath, C. Stroud
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引用次数: 3

摘要

为了保证制造的集成电路的质量,延迟故障的可测试性设计是非常重要的。形式化的验证技术,如时间逻辑,可以帮助避免动态模拟的巨大成本。时间逻辑是评价系统时间行为的一种形式。STeP, Stanford Temporal proof,是斯坦福大学开发的一个系统,用于支持基于时间逻辑规范的并发和响应系统的计算机辅助形式化验证。介绍了时序逻辑和STeP在时延故障可测性建模与分析中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Delay fault testability modeling with temporal logic
To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented.
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