{"title":"基于时间逻辑的延迟故障可测试性建模","authors":"G. Westerman, J. Heath, C. Stroud","doi":"10.1109/AUTEST.1997.633648","DOIUrl":null,"url":null,"abstract":"To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented.","PeriodicalId":369132,"journal":{"name":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Delay fault testability modeling with temporal logic\",\"authors\":\"G. Westerman, J. Heath, C. Stroud\",\"doi\":\"10.1109/AUTEST.1997.633648\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented.\",\"PeriodicalId\":369132,\"journal\":{\"name\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1997.633648\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1997.633648","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Delay fault testability modeling with temporal logic
To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented.