热应力卷曲连接的法医分析

David M. Williams, Michael E. Range, V. Pascucci, Justin T. Savrock
{"title":"热应力卷曲连接的法医分析","authors":"David M. Williams, Michael E. Range, V. Pascucci, Justin T. Savrock","doi":"10.1109/HOLM.2015.7355117","DOIUrl":null,"url":null,"abstract":"Occasionally thermally stressed connectors have come back from the field with initial investigations confirming the crimp height was slightly above the upper design specification limit. Experimental designs were then conceived and conducted independently at both TE Connectivity and Whirlpool Corporation to investigate if the out-of-specification crimp heights were a result of the overheating in the area or potentially the cause of overheating in the area. The results were compared to the known mechanisms for joint degradation including stress relaxation, and cold welding breakdown including spring back analysis. The experimental investigation, coupled with comparison to current crimp models, helps further forensic investigations and the specific understanding of material behavior in crimped connectors.","PeriodicalId":448541,"journal":{"name":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Forensic analysis of thermally stressed crimp connections\",\"authors\":\"David M. Williams, Michael E. Range, V. Pascucci, Justin T. Savrock\",\"doi\":\"10.1109/HOLM.2015.7355117\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Occasionally thermally stressed connectors have come back from the field with initial investigations confirming the crimp height was slightly above the upper design specification limit. Experimental designs were then conceived and conducted independently at both TE Connectivity and Whirlpool Corporation to investigate if the out-of-specification crimp heights were a result of the overheating in the area or potentially the cause of overheating in the area. The results were compared to the known mechanisms for joint degradation including stress relaxation, and cold welding breakdown including spring back analysis. The experimental investigation, coupled with comparison to current crimp models, helps further forensic investigations and the specific understanding of material behavior in crimped connectors.\",\"PeriodicalId\":448541,\"journal\":{\"name\":\"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.2015.7355117\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.2015.7355117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

偶尔会有热应力连接器从现场返回,初步调查确认卷曲高度略高于设计规格上限。然后在TE Connectivity和Whirlpool Corporation独立构思和执行实验设计,以调查超出规格的卷曲高度是该区域过热的结果还是该区域过热的潜在原因。结果与已知的接头退化机制(包括应力松弛)和冷焊击穿(包括回弹分析)进行了比较。实验调查,再加上与当前卷曲模型的比较,有助于进一步的法医调查和卷曲连接器中材料行为的具体理解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Forensic analysis of thermally stressed crimp connections
Occasionally thermally stressed connectors have come back from the field with initial investigations confirming the crimp height was slightly above the upper design specification limit. Experimental designs were then conceived and conducted independently at both TE Connectivity and Whirlpool Corporation to investigate if the out-of-specification crimp heights were a result of the overheating in the area or potentially the cause of overheating in the area. The results were compared to the known mechanisms for joint degradation including stress relaxation, and cold welding breakdown including spring back analysis. The experimental investigation, coupled with comparison to current crimp models, helps further forensic investigations and the specific understanding of material behavior in crimped connectors.
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