电机驱动系统的可靠性:环境条件对电子元件故障率的影响

Frederico A. L. Souza, P. Pereira, H. Paula, B. Filho, A. Rocha
{"title":"电机驱动系统的可靠性:环境条件对电子元件故障率的影响","authors":"Frederico A. L. Souza, P. Pereira, H. Paula, B. Filho, A. Rocha","doi":"10.1109/IAS.2014.6978463","DOIUrl":null,"url":null,"abstract":"This article discusses the actual failure rate of electronic components when these are exposed to harsh environments, which can include vibration, dust, humidity, high temperature and others. It presents a compilation on the physico-chemical effects that can take place when electronic components are stressed and how such effects can reduce the component life. It is also presented a compilation of the results of a thorough and comprehensive research on different standards for reliability prediction, along with a critical and comparative analysis between the methodologies and applications related to each one of them. Furthermore, to provide the reader a broader understanding of the methodology used in these standards, an example employing a typical SV-PWM converter used in motor drive systems, submitted to different environmental stresses, is used as a case study.","PeriodicalId":446068,"journal":{"name":"2014 IEEE Industry Application Society Annual Meeting","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Motor drive systems reliability: Impact of the environment conditions on the electronic component failure rates\",\"authors\":\"Frederico A. L. Souza, P. Pereira, H. Paula, B. Filho, A. Rocha\",\"doi\":\"10.1109/IAS.2014.6978463\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article discusses the actual failure rate of electronic components when these are exposed to harsh environments, which can include vibration, dust, humidity, high temperature and others. It presents a compilation on the physico-chemical effects that can take place when electronic components are stressed and how such effects can reduce the component life. It is also presented a compilation of the results of a thorough and comprehensive research on different standards for reliability prediction, along with a critical and comparative analysis between the methodologies and applications related to each one of them. Furthermore, to provide the reader a broader understanding of the methodology used in these standards, an example employing a typical SV-PWM converter used in motor drive systems, submitted to different environmental stresses, is used as a case study.\",\"PeriodicalId\":446068,\"journal\":{\"name\":\"2014 IEEE Industry Application Society Annual Meeting\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Industry Application Society Annual Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IAS.2014.6978463\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Industry Application Society Annual Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IAS.2014.6978463","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

本文讨论了当电子元件暴露于恶劣环境时的实际故障率,这些环境可能包括振动,灰尘,潮湿,高温等。它介绍了当电子元件受到压力时可能发生的物理化学效应以及这种效应如何减少元件寿命的汇编。它还介绍了对可靠性预测的不同标准进行彻底和全面研究的结果汇编,以及与每个标准相关的方法和应用之间的关键和比较分析。此外,为了让读者更广泛地了解这些标准中使用的方法,采用电机驱动系统中使用的典型SV-PWM转换器的示例,提交给不同的环境应力,作为案例研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Motor drive systems reliability: Impact of the environment conditions on the electronic component failure rates
This article discusses the actual failure rate of electronic components when these are exposed to harsh environments, which can include vibration, dust, humidity, high temperature and others. It presents a compilation on the physico-chemical effects that can take place when electronic components are stressed and how such effects can reduce the component life. It is also presented a compilation of the results of a thorough and comprehensive research on different standards for reliability prediction, along with a critical and comparative analysis between the methodologies and applications related to each one of them. Furthermore, to provide the reader a broader understanding of the methodology used in these standards, an example employing a typical SV-PWM converter used in motor drive systems, submitted to different environmental stresses, is used as a case study.
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