E. Zykova, A. Ieshkin, K. F. Minnebaev, K. E. Ozerova, N. G. Orlikovskaia, E. Rau, A. Tatarintsev
{"title":"绝缘体膜的散射和离子发射","authors":"E. Zykova, A. Ieshkin, K. F. Minnebaev, K. E. Ozerova, N. G. Orlikovskaia, E. Rau, A. Tatarintsev","doi":"10.55959/msu0579-9392.78.2320302","DOIUrl":null,"url":null,"abstract":"To determine the effect of the surface potential of dielectric samples on the yield of positive ions during\nion irradiation, we studied the dependence of the current of secondary particles on the thickness of dielectric\nfilms. It is shown that the yield of positive secondary particles increases significantly with increasing thickness\nif the film charging potential does not exceed the breakdown value determined by the electrical strength of\nthe film. An indirect confirmation of the film charging in these experiments is the time dependence of the\ncurrent from the sample holder. An experimental evaluation of the apparatus effect caused by the emission of\nsecondary electrons from a hemispherical collector has been carried out. Possible mechanisms of the observed\nphenomena are discussed.","PeriodicalId":399279,"journal":{"name":"Seriya 3: Fizika, Astronomiya","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scattering and ion emission from insulator films\",\"authors\":\"E. Zykova, A. Ieshkin, K. F. Minnebaev, K. E. Ozerova, N. G. Orlikovskaia, E. Rau, A. Tatarintsev\",\"doi\":\"10.55959/msu0579-9392.78.2320302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To determine the effect of the surface potential of dielectric samples on the yield of positive ions during\\nion irradiation, we studied the dependence of the current of secondary particles on the thickness of dielectric\\nfilms. It is shown that the yield of positive secondary particles increases significantly with increasing thickness\\nif the film charging potential does not exceed the breakdown value determined by the electrical strength of\\nthe film. An indirect confirmation of the film charging in these experiments is the time dependence of the\\ncurrent from the sample holder. An experimental evaluation of the apparatus effect caused by the emission of\\nsecondary electrons from a hemispherical collector has been carried out. Possible mechanisms of the observed\\nphenomena are discussed.\",\"PeriodicalId\":399279,\"journal\":{\"name\":\"Seriya 3: Fizika, Astronomiya\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Seriya 3: Fizika, Astronomiya\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.55959/msu0579-9392.78.2320302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Seriya 3: Fizika, Astronomiya","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.55959/msu0579-9392.78.2320302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
To determine the effect of the surface potential of dielectric samples on the yield of positive ions during
ion irradiation, we studied the dependence of the current of secondary particles on the thickness of dielectric
films. It is shown that the yield of positive secondary particles increases significantly with increasing thickness
if the film charging potential does not exceed the breakdown value determined by the electrical strength of
the film. An indirect confirmation of the film charging in these experiments is the time dependence of the
current from the sample holder. An experimental evaluation of the apparatus effect caused by the emission of
secondary electrons from a hemispherical collector has been carried out. Possible mechanisms of the observed
phenomena are discussed.