双栅隧道场效应管性能的TCAD评估方法

B. Dewan, M. Yadav
{"title":"双栅隧道场效应管性能的TCAD评估方法","authors":"B. Dewan, M. Yadav","doi":"10.1109/incet49848.2020.9154181","DOIUrl":null,"url":null,"abstract":"This paper analyses the performance of a double-gate tunnel field-effect transistor (DGTFET) using two-dimensional device simulations. DGTFET is compared with double-gate MOSFET and it is observed that DGTFET has lower OFF state current which makes it quite useful in low-power applications. Futhermore, the device parameters such as gate oxide thickness, gate metal work function, dielectric materials and doping concentrations of DGTFET are varied and their effect on drain current and ambipolar current is analyzed. Also, it is observed that the value of subthreshold swing for DGTFET is not limited to 60 mV/decade as in case of MOSFET.","PeriodicalId":174411,"journal":{"name":"2020 International Conference for Emerging Technology (INCET)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A TCAD approach to evaluate the performance of Double Gate Tunnel FET\",\"authors\":\"B. Dewan, M. Yadav\",\"doi\":\"10.1109/incet49848.2020.9154181\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper analyses the performance of a double-gate tunnel field-effect transistor (DGTFET) using two-dimensional device simulations. DGTFET is compared with double-gate MOSFET and it is observed that DGTFET has lower OFF state current which makes it quite useful in low-power applications. Futhermore, the device parameters such as gate oxide thickness, gate metal work function, dielectric materials and doping concentrations of DGTFET are varied and their effect on drain current and ambipolar current is analyzed. Also, it is observed that the value of subthreshold swing for DGTFET is not limited to 60 mV/decade as in case of MOSFET.\",\"PeriodicalId\":174411,\"journal\":{\"name\":\"2020 International Conference for Emerging Technology (INCET)\",\"volume\":\"88 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 International Conference for Emerging Technology (INCET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/incet49848.2020.9154181\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Conference for Emerging Technology (INCET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/incet49848.2020.9154181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

本文采用二维器件模拟的方法分析了双栅隧道场效应晶体管(DGTFET)的性能。将DGTFET与双栅MOSFET进行比较,观察到DGTFET具有更低的OFF状态电流,这使得它在低功耗应用中非常有用。此外,还研究了栅极氧化物厚度、栅极金属功函数、介质材料和掺杂浓度等器件参数的变化,并分析了它们对漏极电流和双极电流的影响。此外,可以观察到dgfet的亚阈值摆幅值不像MOSFET那样限制在60 mV/ 10年。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A TCAD approach to evaluate the performance of Double Gate Tunnel FET
This paper analyses the performance of a double-gate tunnel field-effect transistor (DGTFET) using two-dimensional device simulations. DGTFET is compared with double-gate MOSFET and it is observed that DGTFET has lower OFF state current which makes it quite useful in low-power applications. Futhermore, the device parameters such as gate oxide thickness, gate metal work function, dielectric materials and doping concentrations of DGTFET are varied and their effect on drain current and ambipolar current is analyzed. Also, it is observed that the value of subthreshold swing for DGTFET is not limited to 60 mV/decade as in case of MOSFET.
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