{"title":"基于扫描探针显微镜的新型纳米机械臂研制","authors":"F. Iwata","doi":"10.1109/MHS.2011.6102248","DOIUrl":null,"url":null,"abstract":"Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM) . Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.","PeriodicalId":286457,"journal":{"name":"2011 International Symposium on Micro-NanoMechatronics and Human Science","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Development of novel nanomanipulators based on scanning probe microscopes\",\"authors\":\"F. Iwata\",\"doi\":\"10.1109/MHS.2011.6102248\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM) . Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.\",\"PeriodicalId\":286457,\"journal\":{\"name\":\"2011 International Symposium on Micro-NanoMechatronics and Human Science\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 International Symposium on Micro-NanoMechatronics and Human Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MHS.2011.6102248\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 International Symposium on Micro-NanoMechatronics and Human Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MHS.2011.6102248","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Development of novel nanomanipulators based on scanning probe microscopes
Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM) . Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.