基于扫描探针显微镜的新型纳米机械臂研制

F. Iwata
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引用次数: 0

摘要

扫描探针显微镜(SPMs)是众所周知的纳米级分辨率的表面成像工具。SPMs不仅可以用于地表观测,还可以用于局部地表操作。我们研制了一种基于原子力显微镜(AFM)的纳米机械臂,它可以在扫描电子显微镜的观察下进行操作。演示了利用AFM的触觉控制系统对生物样品进行纳米操作。此外,我们还介绍了一个基于高速原子力显微镜(HS-AFM)的实时纳米操作系统。即使在使用AFM探针的表面操作下,HS-AFM也会定期更新被操作表面的地形图像。该系统可用于样品表面的实时纳米操作和制备。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Development of novel nanomanipulators based on scanning probe microscopes
Scanning probe microscopes (SPMs) are well known as surface imaging tools with nanometer scale resolution. SPMs can be used not only for surface observation but also for local surface manipulation. We have developed a nanometer-scale manipulator based on an atomic force microscope (AFM) which can be operated under observation using a scanning electron microscope. Nano manipulations of biological samples using the haptic control system of the AFM are demonstrated. Furthermore, we introduce a real time nanomanipulation system based on a high-speed atomic force microscopy (HS-AFM) . Even under surface manipulation using the AFM probe, the topographical image of the manipulated surface is periodically updated by HS-AFM. This system would be very useful for real time nano manipulation and fabrication of sample surfaces.
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