加速老化对ZrCu不连续薄层铜触头电阻的影响

Gideon-Gwanzuwang Dankat, Laurenţiu Marius Dumitran, A. Vladescu (Dragomir), Anca Constantina Parau
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引用次数: 0

摘要

电触点的劣化与触点电阻密切相关。电气连接中的接触电阻是许多相互关联的因素的结果,例如,氧化,温度,机械振动,电流通过界面时的变窄,以及来自周围环境的其他污染物。本文通过对制备的物理样品进行加速热老化,并在低电流和低电压范围内评估接触电阻,对电触点的退化进行了实验研究。本研究中使用的电触点样品是通过阴极电弧沉积在覆铜层压板上沉积ZrCu(锆铜)合金涂层制备的。实验结果表明,接触电阻随着接触时间的推移而增加,接触载荷的大小增加了样品之间的总接触面积。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of Accelerated Aging on the Electrical Resistance of Copper Contacts with ZrCu Discontinuous Thin Layer
The degradation of electrical contacts is closely related to contact resistance. Contact resistance in electrical connections is a consequence of numerous factors interlinked, e.g., oxidation, temperature, mechanical vibration, narrowing of electrical current as it passes through the interface, and other contaminants from the surrounding environment. This paper presents an experimental study of the degradation of electrical contacts by performing accelerated thermal aging of fabricated physical samples and evaluating the contact resistance in the low current and voltage range. The electrical contact sample used in this study was prepared by depositing ZrCu (Zirconium Copper) alloy coatings on a copper-clad laminate using cathodic arc deposition. The experimental results indicate that the contact resistance increases as the contacts degrade over time and the size of the contact load improves the total contact area between the samples.
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