{"title":"一种新的电磁干扰源识别方法","authors":"Zhao Yang, D. Su, Yan Liu, X. Gao","doi":"10.1109/APEMC.2012.6237798","DOIUrl":null,"url":null,"abstract":"This paper proposes a novel testing method for the electromagnetic interference source identification. In this method, the test scheme is based on the uniform design principles, after redesign for the radiated emission devices, the validation data from the tests shows that the problems are basically solved. Compared to the previous one-to-one investigation for interference diagnostic tests, the effect of this method is remarkable.","PeriodicalId":300639,"journal":{"name":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A novel electromagnetic interference source identification method\",\"authors\":\"Zhao Yang, D. Su, Yan Liu, X. Gao\",\"doi\":\"10.1109/APEMC.2012.6237798\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a novel testing method for the electromagnetic interference source identification. In this method, the test scheme is based on the uniform design principles, after redesign for the radiated emission devices, the validation data from the tests shows that the problems are basically solved. Compared to the previous one-to-one investigation for interference diagnostic tests, the effect of this method is remarkable.\",\"PeriodicalId\":300639,\"journal\":{\"name\":\"2012 Asia-Pacific Symposium on Electromagnetic Compatibility\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-05-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Asia-Pacific Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2012.6237798\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Asia-Pacific Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2012.6237798","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A novel electromagnetic interference source identification method
This paper proposes a novel testing method for the electromagnetic interference source identification. In this method, the test scheme is based on the uniform design principles, after redesign for the radiated emission devices, the validation data from the tests shows that the problems are basically solved. Compared to the previous one-to-one investigation for interference diagnostic tests, the effect of this method is remarkable.
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