{"title":"MOS VLSI中反馈桥接故障分析","authors":"R. Rajsuman","doi":"10.1109/VTEST.1991.208132","DOIUrl":null,"url":null,"abstract":"The feedback bridging faults are examined in detail for MOS digital circuits. A necessary condition is obtained which needs to be satisfied for oscillations in the circuit. Expression are given to predict the frequency and amplitude of oscillations. It is shown that when a feedback bridging fault does not cause oscillations, it creates an anomalous output. Such faults may not be detected by logic testing: the authors recommend measurement of power supply current to detect such faults in CMOS circuit.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"An analysis of feedback bridging faults in MOS VLSI\",\"authors\":\"R. Rajsuman\",\"doi\":\"10.1109/VTEST.1991.208132\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The feedback bridging faults are examined in detail for MOS digital circuits. A necessary condition is obtained which needs to be satisfied for oscillations in the circuit. Expression are given to predict the frequency and amplitude of oscillations. It is shown that when a feedback bridging fault does not cause oscillations, it creates an anomalous output. Such faults may not be detected by logic testing: the authors recommend measurement of power supply current to detect such faults in CMOS circuit.<<ETX>>\",\"PeriodicalId\":157539,\"journal\":{\"name\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"volume\":\"55 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1991.208132\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An analysis of feedback bridging faults in MOS VLSI
The feedback bridging faults are examined in detail for MOS digital circuits. A necessary condition is obtained which needs to be satisfied for oscillations in the circuit. Expression are given to predict the frequency and amplitude of oscillations. It is shown that when a feedback bridging fault does not cause oscillations, it creates an anomalous output. Such faults may not be detected by logic testing: the authors recommend measurement of power supply current to detect such faults in CMOS circuit.<>