在美国实验中击穿电流和电压波形中的电压降、锯齿振荡和高频爆发

2012 24th International Symposium on Power Semiconductor Devices and ICs Pub Date : 2012-06-03 DOI:10.1109/ISPSD.2012.6229049

A. Irace, P. Spirito, M. Riccio, G. Breglio

{"title":"在美国实验中击穿电流和电压波形中的电压降、锯齿振荡和高频爆发","authors":"A. Irace, P. Spirito, M. Riccio, G. Breglio","doi":"10.1109/ISPSD.2012.6229049","DOIUrl":null,"url":null,"abstract":"The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.","PeriodicalId":371298,"journal":{"name":"2012 24th International Symposium on Power Semiconductor Devices and ICs","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments\",\"authors\":\"A. Irace, P. Spirito, M. Riccio, G. Breglio\",\"doi\":\"10.1109/ISPSD.2012.6229049\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.\",\"PeriodicalId\":371298,\"journal\":{\"name\":\"2012 24th International Symposium on Power Semiconductor Devices and ICs\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 24th International Symposium on Power Semiconductor Devices and ICs\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.2012.6229049\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 24th International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2012.6229049","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 19

摘要

本文的目的是分析UIS测试的典型电压和电流波形，以寻找电流传导不均匀行为的特征。这些信息可以帮助识别最终导致设备故障的现象，降低其在雪崩操作中维持高电流的能力或损害设备的长期可靠性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments

The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.

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2012 24th International Symposium on Power Semiconductor Devices and ICs

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