利用凸缘波导测量几何结构减少低损耗材料表征中的测量足迹

M. Hyde, M. Havrilla
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引用次数: 7

摘要

本文的目的是演示如何将最初设计用于表征损耗材料的法兰波导材料表征技术扩展到准确提取低损耗材料的介电常数和磁导率。本文对法兰波导技术进行了综述。随后讨论了如何利用时域门控来减轻从法兰边缘反射的波所带来的误差。结果表明,采用时域门控可以显著减小法兰的横截面尺寸。最后,给出了有机玻璃的材料测量结果,验证了时域门控技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry
The purpose of this paper is to demonstrate how the flanged-waveguide material-characterization technique, originally designed to characterize lossy materials only, can be extended to accurately extract permittivity and permeability of low-loss materials. Provided in this paper is a summary of the flanged-waveguide technique. This is followed by a discussion of how time-domain gating can be utilized to mitigate the error introduced by waves reflected from the edges of the flanges. Furthermore, it is demonstrated that by utilizing timedomain gating, the cross-sectional dimensions of the flanges can be significantly reduced. Lastly, material measurement results of plexiglass are provided to validate the time-domain gating technique.
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