电流积分法电工树诊断技术

S. Iwata, Ryota Kitani, T. Takada
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引用次数: 4

摘要

采用电流集成系统(以下简称“Q(t)-meter”)的新诊断技术对高分子材料绝缘性能的退化进行了评价。Q(t)-meter测量插入在直流高压电源和所研究的绝缘材料样品之间的电容器所积累的综合电荷随时间的变化。Q(t)表适用于直流电压下绝缘试样泄漏电流随时间变化的监测。为了证明这种新装置的性能,我们评估了环氧树脂样品中“电树”的产生和传播对直流泄漏电流的影响。电树是一种典型的聚合物材料的电降解。因此,期望电树的无损诊断方法。在本研究中,两针电极之间的交流高压在环氧树脂中产生电树。电极间距为2mm。在Q(t)测量中,采样频率为2 s,总采样时间为600 s,直流施加时间为900 s,测试电压为250 ~ 1000 V。我们在电气采树的三个阶段进行了Q(t)测量——树生成前、树生成后和树繁殖后。结果表明,泄漏电流随树长增加而增大。在Q(t)曲线上也观察到明显的急剧上升和下降趋势。假设“RC电路模型”,对Q(t)计得到的实验结果进行了分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Diagnostic Technique for Electrical Tree by Current Integration Method
The degradation of insulating property of polymeric materials was evaluated by the new diagnostic technique of current integration system, hereafter referred to as the “Q(t)-meter”. The Q(t)-meter measures the change with time in integrated charge accumulated by a capacitor inserted between a DC high-voltage power supply and a sample of the insulation material under study. Q(t)-meter is suitable for the monitoring of time dependence of leakage current of the insulating sample under DC voltage. To demonstrate the performance of this new device, we evaluated the influence of generation and propagation of “electrical tree” in epoxy resin sample on DC leakage current. The electrical tree is a typical electrical degradation of polymeric materials. Hence, nondestructive diagnostic methods for electrical tree are expected. In this study, the electrical tree was generated in the epoxy resin by AC high voltage between two needle electrodes. The interelectrode distance was 2 mm. In the Q(t) measurement, the sampling frequency, total sampling time, DC applied time, and test voltages were 2 s, 600 s, 900 s, 250-1,000 V, respectively. We conducted Q(t) measurement at three stages of electrical treeing - before tree generation, after tree generation, and after tree propagation. It was found that the leakage current increased with increase in the tree length. A remarkable trend of steep rise and fall in the Q(t) curve was also observed. Experimental results obtained by the Q(t)-meter were analyzed assuming an “RC circuit model”.
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