VLSI网格阵列处理器的分布式自诊断

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208155

M. Cutler, S. Su, Mingshien Wang

{"title":"VLSI网格阵列处理器的分布式自诊断","authors":"M. Cutler, S. Su, Mingshien Wang","doi":"10.1109/VTEST.1991.208155","DOIUrl":null,"url":null,"abstract":"A distributed self-diagnosis algorithm for VLSI mesh arrays with small clusters of faults is presented. It allows only fault-free cells to make decisions and to propagate diagnosis results. Its time complexity is constant with respect to the number of processors. The diagnosability is proportional to the array size.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Distributed self-diagnosis of VLSI mesh array processors\",\"authors\":\"M. Cutler, S. Su, Mingshien Wang\",\"doi\":\"10.1109/VTEST.1991.208155\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A distributed self-diagnosis algorithm for VLSI mesh arrays with small clusters of faults is presented. It allows only fault-free cells to make decisions and to propagate diagnosis results. Its time complexity is constant with respect to the number of processors. The diagnosability is proportional to the array size.<<ETX>>\",\"PeriodicalId\":157539,\"journal\":{\"name\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"volume\":\"25 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1991.208155\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

针对超大规模集成电路网格阵列的小簇故障，提出了一种分布式自诊断算法。它只允许无故障的细胞做出决定并传播诊断结果。它的时间复杂度相对于处理器的数量是恒定的。可诊断性与阵列大小成正比。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Distributed self-diagnosis of VLSI mesh array processors

A distributed self-diagnosis algorithm for VLSI mesh arrays with small clusters of faults is presented. It allows only fault-free cells to make decisions and to propagate diagnosis results. Its time complexity is constant with respect to the number of processors. The diagnosability is proportional to the array size.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

自引率

0.00%

发文量