T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang
{"title":"集成数据挖掘应用的物联网启发的半导体可靠性测试系统","authors":"T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang","doi":"10.1109/CCIOT.2016.7868314","DOIUrl":null,"url":null,"abstract":"Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.","PeriodicalId":384484,"journal":{"name":"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An IoT inspired semiconductor Reliability test system integrated with data-mining applications\",\"authors\":\"T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang\",\"doi\":\"10.1109/CCIOT.2016.7868314\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.\",\"PeriodicalId\":384484,\"journal\":{\"name\":\"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCIOT.2016.7868314\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCIOT.2016.7868314","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An IoT inspired semiconductor Reliability test system integrated with data-mining applications
Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.