集成数据挖掘应用的物联网启发的半导体可靠性测试系统

2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT) Pub Date : 2016-10-01 DOI:10.1109/CCIOT.2016.7868314

T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang

{"title":"集成数据挖掘应用的物联网启发的半导体可靠性测试系统","authors":"T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang","doi":"10.1109/CCIOT.2016.7868314","DOIUrl":null,"url":null,"abstract":"Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.","PeriodicalId":384484,"journal":{"name":"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An IoT inspired semiconductor Reliability test system integrated with data-mining applications\",\"authors\":\"T. J. Tang, Andrew Chung, A. Zhao, Randy Kang, Mark Zhang, Kary Chien, Jungang Yang, Jie Zhang\",\"doi\":\"10.1109/CCIOT.2016.7868314\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.\",\"PeriodicalId\":384484,\"journal\":{\"name\":\"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CCIOT.2016.7868314\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CCIOT.2016.7868314","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

可靠性评估是保证产品质量的关键环节。随着半导体技术的不断发展，可靠性测试过程也变得复杂，涉及到负责不同测试任务的工程师和技术助理。本文提出了一种集在线测试请求、数据库管理和测试数据分析于一体的综合可靠性管理与指标系统的设计。此外，系统收集到的大数据也为新的可靠性数据分析方法提供了潜在的数据挖掘应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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An IoT inspired semiconductor Reliability test system integrated with data-mining applications

Reliability assessment is a key step in ensuring the quality of a product. As semiconductor technology continues to evolve, the reliability test process also complicates, involving engineers and technical assistants responsible for different test tasks. In this paper, we propose a design of a comprehensive Reliability Management and Index System that integrates online test requests, database management and test data analysis. In addition, the resultant big data collected by the system inspire potential data-mining applications for new reliability data-analysis approaches.

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2016 2nd International Conference on Cloud Computing and Internet of Things (CCIOT)

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