Weijun Jiang, X. Ye, Qisen Sun, Bokai Zheng, G. Zhai
{"title":"考虑软、硬故障的模拟/混合信号电子设备预测仿真方法","authors":"Weijun Jiang, X. Ye, Qisen Sun, Bokai Zheng, G. Zhai","doi":"10.1109/PHM-Yantai55411.2022.9942141","DOIUrl":null,"url":null,"abstract":"Aiming at the problems that the reliability prediction simulation does not consider both soft faults (performance degradation) and hard faults (function failure) of devices, and the difficulty of simulation of Analog/Mixed Signal (AMS) circuits, this paper proposes a simulation method for reliability prediction of AMS electronic equipment. Considering soft faults and hard faults, the digital device model is established through the Hardware Description Language (HDL) model and the Input/Output Buffer Information Specification (IBIS) model, and the analog device model is established through the Hardware Description Language-Analog/Mixed Signal (HDL-AMS) model. Finally, the reliable life of the electronic equipment is obtained by analyzing the simulation results. This paper uses a typical AMS communication circuit as an example to demonstrate the practicability of the proposed method.","PeriodicalId":315994,"journal":{"name":"2022 Global Reliability and Prognostics and Health Management (PHM-Yantai)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Prediction Simulation Method for Analog/Mixed Signal Electronic Equipment Considering Soft and Hard Faults\",\"authors\":\"Weijun Jiang, X. Ye, Qisen Sun, Bokai Zheng, G. Zhai\",\"doi\":\"10.1109/PHM-Yantai55411.2022.9942141\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Aiming at the problems that the reliability prediction simulation does not consider both soft faults (performance degradation) and hard faults (function failure) of devices, and the difficulty of simulation of Analog/Mixed Signal (AMS) circuits, this paper proposes a simulation method for reliability prediction of AMS electronic equipment. Considering soft faults and hard faults, the digital device model is established through the Hardware Description Language (HDL) model and the Input/Output Buffer Information Specification (IBIS) model, and the analog device model is established through the Hardware Description Language-Analog/Mixed Signal (HDL-AMS) model. Finally, the reliable life of the electronic equipment is obtained by analyzing the simulation results. This paper uses a typical AMS communication circuit as an example to demonstrate the practicability of the proposed method.\",\"PeriodicalId\":315994,\"journal\":{\"name\":\"2022 Global Reliability and Prognostics and Health Management (PHM-Yantai)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Global Reliability and Prognostics and Health Management (PHM-Yantai)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PHM-Yantai55411.2022.9942141\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Global Reliability and Prognostics and Health Management (PHM-Yantai)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PHM-Yantai55411.2022.9942141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Prediction Simulation Method for Analog/Mixed Signal Electronic Equipment Considering Soft and Hard Faults
Aiming at the problems that the reliability prediction simulation does not consider both soft faults (performance degradation) and hard faults (function failure) of devices, and the difficulty of simulation of Analog/Mixed Signal (AMS) circuits, this paper proposes a simulation method for reliability prediction of AMS electronic equipment. Considering soft faults and hard faults, the digital device model is established through the Hardware Description Language (HDL) model and the Input/Output Buffer Information Specification (IBIS) model, and the analog device model is established through the Hardware Description Language-Analog/Mixed Signal (HDL-AMS) model. Finally, the reliable life of the electronic equipment is obtained by analyzing the simulation results. This paper uses a typical AMS communication circuit as an example to demonstrate the practicability of the proposed method.