考虑软、硬故障的模拟/混合信号电子设备预测仿真方法

Weijun Jiang, X. Ye, Qisen Sun, Bokai Zheng, G. Zhai
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引用次数: 0

摘要

针对可靠性预测仿真未同时考虑设备软故障(性能下降)和硬故障(功能失效)以及模拟/混合信号(AMS)电路仿真困难的问题,提出了一种AMS电子设备可靠性预测仿真方法。考虑软故障和硬故障,通过硬件描述语言(HDL)模型和输入/输出缓冲信息规范(IBIS)模型建立数字设备模型,通过硬件描述语言-模拟/混合信号(HDL- ams)模型建立模拟设备模型。最后,通过对仿真结果的分析,得出了电子设备的可靠寿命。以典型的AMS通信电路为例,验证了该方法的实用性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Prediction Simulation Method for Analog/Mixed Signal Electronic Equipment Considering Soft and Hard Faults
Aiming at the problems that the reliability prediction simulation does not consider both soft faults (performance degradation) and hard faults (function failure) of devices, and the difficulty of simulation of Analog/Mixed Signal (AMS) circuits, this paper proposes a simulation method for reliability prediction of AMS electronic equipment. Considering soft faults and hard faults, the digital device model is established through the Hardware Description Language (HDL) model and the Input/Output Buffer Information Specification (IBIS) model, and the analog device model is established through the Hardware Description Language-Analog/Mixed Signal (HDL-AMS) model. Finally, the reliable life of the electronic equipment is obtained by analyzing the simulation results. This paper uses a typical AMS communication circuit as an example to demonstrate the practicability of the proposed method.
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