用于高密度3d封装的替代z轴连接器技术

S. Spiesshoefer, L. Schaper, K. Maner, E. Porter, F. Barlow, M. Glover, W. Marsh, G. Bates, M. Lucas
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引用次数: 3

摘要

本文介绍了适用于三维处理器模块的z轴互连的研究结果。我们讨论了预期系统的优点和缺点。其中一种选择的互连介质是由信越制造的,它基于嵌入聚合物材料基体中的金属线。电线从聚合物薄膜的表面伸出来。通过在衬底之间压缩这种材料,通过嵌入的导线在衬底上的金属化金衬垫之间进行接触。Shin-Etsu连接器允许在0.5 mm间距的多个基板之间连接,而不需要精确的连接器校准,因为它包含非常细间距的冗余导线。第二种互连方法是由FormFactor公司制造的,它使用金属键合机在一系列金属化衬垫上制造出具有弹簧形状的金线,这些金属衬垫是在测试插座或中间层上制造的。本文介绍了确定连接器性能和可靠性的测试程序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Alternative Z-axis connector technologies for high-density 3-D packaging
This paper addresses the result of research on Z-axis interconnects suitable for 3-D processor modules. We discuss the advantages and disadvantages for the intended system. One selected interconnection medium, which is manufactured by Shin-Etsu, is based on metal wires embedded in a matrix of polymeric material. The wires protrude from the surface of the polymer film. By compressing this material between substrates, contact is made between metallized gold pads on the substrates via the embedded wires. The Shin-Etsu connector allows connections among multiple substrates at 0.5-mm pitch without the need for precision connector alignment because it contains redundant wires at very fine pitch. The second interconnection method, which is manufactured by FormFactor, uses a wire bonder to create gold wires with spring-like geometries on an array of metallized pads, fabricated on a test socket or interposer. This paper describes the testing program to determine connector performance and reliability.
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