量子元胞自动机故障检测新技术

2008 First International Conference on Emerging Trends in Engineering and Technology Pub Date : 2008-07-16 DOI:10.1109/ICETET.2008.186

Binu K. Mathew, Shajimon K. John, C. Pradeep

{"title":"量子元胞自动机故障检测新技术","authors":"Binu K. Mathew, Shajimon K. John, C. Pradeep","doi":"10.1109/ICETET.2008.186","DOIUrl":null,"url":null,"abstract":"Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.","PeriodicalId":269929,"journal":{"name":"2008 First International Conference on Emerging Trends in Engineering and Technology","volume":"117 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"New Technique for Fault Detection in Quantum Cellular Automata\",\"authors\":\"Binu K. Mathew, Shajimon K. John, C. Pradeep\",\"doi\":\"10.1109/ICETET.2008.186\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.\",\"PeriodicalId\":269929,\"journal\":{\"name\":\"2008 First International Conference on Emerging Trends in Engineering and Technology\",\"volume\":\"117 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 First International Conference on Emerging Trends in Engineering and Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICETET.2008.186\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 First International Conference on Emerging Trends in Engineering and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICETET.2008.186","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 6

摘要

量子元胞自动机(QCA)电路是近年来受到广泛关注的新一代纳米技术。本文提出了一种基于QCA的电路卡死故障检测框架。现有的技术和方法不能保证检测出卡滞故障。这项工作的动机是电路的卡在故障测试集不能保证检测到在其QCA实现中可能发生的所有缺陷。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

New Technique for Fault Detection in Quantum Cellular Automata

Quantum cellular automata (QCA) circuits, the new generation nanotechnology with wide attention in recent years. In this we are proposing a framework based on QCA for finding out the stuck-at fault of a circuit. The existing technologies and methods are not guaranteed to detect the stuck-at faults. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2008 First International Conference on Emerging Trends in Engineering and Technology

自引率

0.00%

发文量