材料成像分析仪MIA

{"title":"材料成像分析仪MIA","authors":"B. Thornberg","doi":"10.1109/sas54819.2022.9881374","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":129732,"journal":{"name":"2022 IEEE Sensors Applications Symposium (SAS)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"The Material Imaging Analyzer MIA\",\"authors\":\"B. Thornberg\",\"doi\":\"10.1109/sas54819.2022.9881374\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":129732,\"journal\":{\"name\":\"2022 IEEE Sensors Applications Symposium (SAS)\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Sensors Applications Symposium (SAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/sas54819.2022.9881374\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Sensors Applications Symposium (SAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/sas54819.2022.9881374","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}