VHDL门级模型的功能故障仿真

S. Aftabjahani, Z. Navabi
{"title":"VHDL门级模型的功能故障仿真","authors":"S. Aftabjahani, Z. Navabi","doi":"10.1109/VIUF.1997.623925","DOIUrl":null,"url":null,"abstract":"A method of fault injection and fault simulation is proposed. A gate level circuit is modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations is given.","PeriodicalId":212876,"journal":{"name":"Proceedings VHDL International Users' Forum. Fall Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1997-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Functional fault simulation of VHDL gate level models\",\"authors\":\"S. Aftabjahani, Z. Navabi\",\"doi\":\"10.1109/VIUF.1997.623925\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method of fault injection and fault simulation is proposed. A gate level circuit is modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations is given.\",\"PeriodicalId\":212876,\"journal\":{\"name\":\"Proceedings VHDL International Users' Forum. Fall Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings VHDL International Users' Forum. Fall Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VIUF.1997.623925\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings VHDL International Users' Forum. Fall Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VIUF.1997.623925","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9

摘要

提出了一种故障注入和故障模拟的方法。门级电路被修改为包括逻辑门,其中故障将被注入。分配给电路新增加的输入的值具有在原电路的各线路注入卡滞故障的效果。得到了表示新改变电路的功能模型。该可故障模型可以使用标准的VHDL模拟器进行仿真。编写了获取该模型和创建可仿真VHDL模型的程序。并与其它基于VHDL的故障仿真进行了比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Functional fault simulation of VHDL gate level models
A method of fault injection and fault simulation is proposed. A gate level circuit is modified to include logic gates where faults are to be injected. Values assigned to the inputs of the new additions of the circuit have the effect of injecting stuck-at faults at various lines of the original circuit. A functional model is obtained to represent the new altered circuit. This faultable model can be simulated using a standard VHDL simulator. A program for obtaining this model and creating a simulatable VHDL model has been developed. A comparison with other VHDL based fault simulations is given.
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