{"title":"用于分布式嵌入式系统的自动化高精度混合测量","authors":"Marcus Thoss","doi":"10.1109/WISES.2005.1438710","DOIUrl":null,"url":null,"abstract":"This paper presents the design and realisation of a hybrid, high-accuracy, automated measurement framework. A hybrid measurement system is introduced that has been successfully used to carry out high-accuracy measurements in distributed automation environments. The application of the hybrid measurement system is not limited to such environments, though. It is characterised by monitoring distributed events with low interference and by the usage of global timestamps based on the high-resolution clock of a logic analyser. Furthermore, it exhibits an extensively automated experiment control and data analysis framework. Measurement results gained with the approach are presented as well.","PeriodicalId":266947,"journal":{"name":"Third International Workshop on Intelligent Solutions in Embedded Systems, 2005.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Automated high-accuracy hybrid measurement for distributed embedded systems\",\"authors\":\"Marcus Thoss\",\"doi\":\"10.1109/WISES.2005.1438710\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the design and realisation of a hybrid, high-accuracy, automated measurement framework. A hybrid measurement system is introduced that has been successfully used to carry out high-accuracy measurements in distributed automation environments. The application of the hybrid measurement system is not limited to such environments, though. It is characterised by monitoring distributed events with low interference and by the usage of global timestamps based on the high-resolution clock of a logic analyser. Furthermore, it exhibits an extensively automated experiment control and data analysis framework. Measurement results gained with the approach are presented as well.\",\"PeriodicalId\":266947,\"journal\":{\"name\":\"Third International Workshop on Intelligent Solutions in Embedded Systems, 2005.\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third International Workshop on Intelligent Solutions in Embedded Systems, 2005.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WISES.2005.1438710\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third International Workshop on Intelligent Solutions in Embedded Systems, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WISES.2005.1438710","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Automated high-accuracy hybrid measurement for distributed embedded systems
This paper presents the design and realisation of a hybrid, high-accuracy, automated measurement framework. A hybrid measurement system is introduced that has been successfully used to carry out high-accuracy measurements in distributed automation environments. The application of the hybrid measurement system is not limited to such environments, though. It is characterised by monitoring distributed events with low interference and by the usage of global timestamps based on the high-resolution clock of a logic analyser. Furthermore, it exhibits an extensively automated experiment control and data analysis framework. Measurement results gained with the approach are presented as well.