{"title":"可生存的自检顺序电路","authors":"A. Matrosova, S. Ostanin, I. Levin","doi":"10.1109/DFTVS.2001.966793","DOIUrl":null,"url":null,"abstract":"This paper presents a method for designing totally self-checking synchronous sequential circuits (SSC), and investigates their behavior in presence of transient faults. We deal with the case when the circuit is able to recover after the number of clocks. We call SSC owing this property as a survivable SSC. A concept of a partially monotonous SSC is developed in the paper. It is proven that the partially monotonous SSCs are survivable.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Survivable self-checking sequential circuits\",\"authors\":\"A. Matrosova, S. Ostanin, I. Levin\",\"doi\":\"10.1109/DFTVS.2001.966793\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a method for designing totally self-checking synchronous sequential circuits (SSC), and investigates their behavior in presence of transient faults. We deal with the case when the circuit is able to recover after the number of clocks. We call SSC owing this property as a survivable SSC. A concept of a partially monotonous SSC is developed in the paper. It is proven that the partially monotonous SSCs are survivable.\",\"PeriodicalId\":187031,\"journal\":{\"name\":\"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.2001.966793\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966793","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a method for designing totally self-checking synchronous sequential circuits (SSC), and investigates their behavior in presence of transient faults. We deal with the case when the circuit is able to recover after the number of clocks. We call SSC owing this property as a survivable SSC. A concept of a partially monotonous SSC is developed in the paper. It is proven that the partially monotonous SSCs are survivable.