使用常规技术测试专家系统

[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference Pub Date : 1992-09-21 DOI:10.1109/CMPSAC.1992.217584

W. Tsai, Shekhar H. Kirani, I. Zualkernan

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引用次数: 5

摘要

作者描述了测试专家系统的生命周期方法。他们评论了与测试专家系统相关的困难。为了解决这些问题，提出了传统软件工程的实用测试方法。本文以专家系统MAPS为例，对超大规模集成电路(VLSI)制造环境中由工艺缺陷引起的双极晶体管故障进行诊断

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Testing expert systems using conventional techniques

The authors describe a life-cycle approach for testing expert systems. They comment on the difficulties associated with testing of an expert system. Pragmatic testing methods of conventional software engineering are proposed as a solution to these problems. The application of these techniques is illustrated through an extended example for the expert system, MAPS, which diagnoses faults in a bipolar transistor induced to process defects in a VLSI manufacturing environment.<>

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[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference

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