广域垂直扩展(WAVE/sup TM/)封装设计,适用于高速应用:可靠性和性能

Young-Gon Kim, I. Mohammed, Byongsu Seol, T. Kang
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引用次数: 21

摘要

开发了一种基于双金属柔性的WAVE封装,以取代基于四金属刚性的PBGA封装。高板级可靠性是该项目的主要动机,而等效的电气性能是一个具有挑战性的目标。所有的包尺寸都保持与参考包相同,以允许直接更换。经过一年的开发计划,该系统成功地满足了可靠性和性能要求。本文主要介绍了WAVE包的可靠性和性能设计。最佳导联设计是可靠封装开发的最重要步骤。开发了WAVE几何模型(WAVEGM)来分析导联类型、导联方向、凸起高度和注入举升高度。选择2金属柔性带来取代原来的4金属刚性衬底,因为它具有更薄的介电层,更低的介电常数和改进的痕迹/空间设计能力。通过对试验装置的仿真和实际测量,验证了该装置的电性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Wide area vertical expansion (WAVE/sup TM/) package design for high speed application: reliability and performance
A two metal flex-based WAVE package has been developed to replace four metal rigid based PBGA package. High board-level reliability was the primary motivation for this project and an equivalent electrical performance was a challenging target. All the package dimensions were maintained the same as the reference package to allow direct replacement. As a result of the one-year-long development program, the required reliability and performance goals were met successfully. This paper mainly describes the WAVE package design for reliability and performance. Optimal lead design is the most important step for reliable package development. The WAVE geometry model (WAVEGM) was developed to analyze the lead type, lead orientation, bump height, and injection lift height. The 2-metal flex tape was chosen to replace the original 4-metal rigid substrate due to its thinner dielectric layer, lower dielectric constant and improved trace/space design capability. The electrical performance was verified by both simulation and actual measurements of a test device.
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