寄存器内重复:利用窄宽度值提高寄存器文件可靠性

Jie S. Hu, Shuai Wang, Sotirios G. Ziavras
{"title":"寄存器内重复:利用窄宽度值提高寄存器文件可靠性","authors":"Jie S. Hu, Shuai Wang, Sotirios G. Ziavras","doi":"10.1109/DSN.2006.43","DOIUrl":null,"url":null,"abstract":"Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for duplicating a copy of the value within the same data item, called in-register duplication (IRD), eliminating the requirement of additional copy registers. The datapath pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. Our experimental evaluation using the SPEC CINT2000 benchmark suite shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes","PeriodicalId":228470,"journal":{"name":"International Conference on Dependable Systems and Networks (DSN'06)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"79","resultStr":"{\"title\":\"In-Register Duplication: Exploiting Narrow-Width Value for Improving Register File Reliability\",\"authors\":\"Jie S. Hu, Shuai Wang, Sotirios G. Ziavras\",\"doi\":\"10.1109/DSN.2006.43\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for duplicating a copy of the value within the same data item, called in-register duplication (IRD), eliminating the requirement of additional copy registers. The datapath pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. Our experimental evaluation using the SPEC CINT2000 benchmark suite shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes\",\"PeriodicalId\":228470,\"journal\":{\"name\":\"International Conference on Dependable Systems and Networks (DSN'06)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"79\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Dependable Systems and Networks (DSN'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSN.2006.43\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Dependable Systems and Networks (DSN'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2006.43","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 79

摘要

由于CMOS电路对高能粒子撞击引起的软误差越来越敏感,保护寄存器值及其数据总线对于高性能微处理器的可靠计算至关重要。由于寄存器文件位于处理器管道的关键路径中,任何增加寄存器文件压力或寄存器文件访问延迟的可靠设计都是不可取的。在本文中,我们建议利用窄宽度寄存器值,它表示大部分生成的值,用于在同一数据项中复制值的副本,称为寄存器内复制(IRD),从而消除了对额外复制寄存器的要求。增强了数据路径管道,有效地结合了奇偶编码和奇偶校验,使IRD无缝地支持错误恢复,并且奇偶校验与执行阶段重叠,避免增加关键路径。我们使用SPEC CINT2000基准测试套件进行的实验评估表明,与以前的可靠性方案相比,IRD在严重错误注入下提供了更高的副本读取(RWD)和错误检测/恢复率
本文章由计算机程序翻译,如有差异,请以英文原文为准。
In-Register Duplication: Exploiting Narrow-Width Value for Improving Register File Reliability
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for duplicating a copy of the value within the same data item, called in-register duplication (IRD), eliminating the requirement of additional copy registers. The datapath pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. Our experimental evaluation using the SPEC CINT2000 benchmark suite shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信