A method for the consistent reporting of fault coverage

A standard procedure has been developed for fault coverage measurement. Procedure 5012 of MIL-STD-883 governs the reporting of fault coverage for digital microcircuits for military applications. It describes requirements for the development of the logic model for an IC, fault universe, fault simulation, and reporting of results. Procedure 5012 provides a consistent means of measuring fault coverage for an integrated circuit regardless of the specific logic and fault simulator used. It addresses the testing of complex, embedded structures that are not implemented in terms of logic gates, such as RAMs, ROMs, and PLAs. Fault coverages for gate-level and non-gate-level structures are weighted by transistor counts to arrive at an overall fault coverage value. The procedure addresses built-in-self-test based on the use of linear feedback shift registers for output data compaction. Two fault sampling procedures are permitted. A Fault Simulation Report documents the fault coverage level obtained, as well as the assumptions, approximations, and methods used.<>