光折变Bi12SiO20晶体全息存储信息的准无损读出

A. Delboulbé, C. Fromont, J. Herriau, S. Mallick, J. Huignard
{"title":"光折变Bi12SiO20晶体全息存储信息的准无损读出","authors":"A. Delboulbé, C. Fromont, J. Herriau, S. Mallick, J. Huignard","doi":"10.1063/1.102441","DOIUrl":null,"url":null,"abstract":"We report the existence of a room temperature hologram fixing process in certain Bi12SiO2 (BSO) crystals, which appears to be due to the formation of a complementary grating of positive charges that compensates the photo-induced electronic space-charge field(1,2). Uniform illumination of the crystal with green light, in presence of an external D.C. electric field, erases the deep-level electronic charge pattern and reveals the positive charge grating which then decays with its own characteristic decay time. We believe, in agreement with the work of Strohkendl(3), that the hole charge pattern involves shallow traps. Since these traps can be thermally activated, the decay time constant can be further increased significantly by lowering the crystal temperature.","PeriodicalId":385625,"journal":{"name":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Quasi-Nondestructive Readout of Holographically Stored Information in Photorefractive Bi12SiO20 Crystals\",\"authors\":\"A. Delboulbé, C. Fromont, J. Herriau, S. Mallick, J. Huignard\",\"doi\":\"10.1063/1.102441\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the existence of a room temperature hologram fixing process in certain Bi12SiO2 (BSO) crystals, which appears to be due to the formation of a complementary grating of positive charges that compensates the photo-induced electronic space-charge field(1,2). Uniform illumination of the crystal with green light, in presence of an external D.C. electric field, erases the deep-level electronic charge pattern and reveals the positive charge grating which then decays with its own characteristic decay time. We believe, in agreement with the work of Strohkendl(3), that the hole charge pattern involves shallow traps. Since these traps can be thermally activated, the decay time constant can be further increased significantly by lowering the crystal temperature.\",\"PeriodicalId\":385625,\"journal\":{\"name\":\"Topical Meeting on Photorefractive Materials, Effects, and Devices II\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Topical Meeting on Photorefractive Materials, Effects, and Devices II\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/1.102441\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Topical Meeting on Photorefractive Materials, Effects, and Devices II","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.102441","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 31

摘要

我们报道了在某些Bi12SiO2 (BSO)晶体中存在室温全息图固定过程,这似乎是由于正电荷互补光栅的形成补偿了光诱导的电子空间电荷场(1,2)。在外部直流电场的作用下,用绿光均匀照射晶体,可以消除深层电子电荷模式,并显示出正电荷光栅,然后以其自身的特征衰减时间衰减。我们认为,与Strohkendl(3)的工作一致,空穴电荷模式涉及浅阱。由于这些陷阱可以被热激活,降低晶体温度可以进一步显著增加衰减时间常数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Quasi-Nondestructive Readout of Holographically Stored Information in Photorefractive Bi12SiO20 Crystals
We report the existence of a room temperature hologram fixing process in certain Bi12SiO2 (BSO) crystals, which appears to be due to the formation of a complementary grating of positive charges that compensates the photo-induced electronic space-charge field(1,2). Uniform illumination of the crystal with green light, in presence of an external D.C. electric field, erases the deep-level electronic charge pattern and reveals the positive charge grating which then decays with its own characteristic decay time. We believe, in agreement with the work of Strohkendl(3), that the hole charge pattern involves shallow traps. Since these traps can be thermally activated, the decay time constant can be further increased significantly by lowering the crystal temperature.
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