自动化纳米结构显微图像表征和分析

V. Zeljkovic, C. Tameze, D. Pochan, Yingchao Chen, V. Valev
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引用次数: 2

摘要

纳米颗粒是指一维尺寸小于等于100纳米的材料颗粒。当加工成纳米粒子时,许多传统的有机和无机材料的性质发生了变化。由于纳米粒子可以由有机或无机物质制成,它们在潜在的技术应用中用途广泛,从精密的电子产品到革命性的医疗程序。虽然从表征测量和观察中可以清楚地看到平均结构和大小,但最终纳米颗粒系统的大小和形状总是分散的。尽管显微镜是一种捕捉纳米颗粒形貌的直接图像的优秀技术,但仅通过观察显微镜数据很难评估纳米结构在大小和形状上的分散性。这就是为什么我们提出了一种计算机辅助工具,用于方便的纳米颗粒检测及其形态识别。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automated nanostructure microscopic image characterization and analysis
Nanoparticles represent material particles in which one dimension measures ~100 nanometers or less. When processed into nanoparticles, the properties of many conventional organic and inorganic materials change. Since nanoparticles can be made from organic or inorganic substances, they are versatile in potential technological applications, from delicate electronics to revolutionary medical procedures. While an average structure and size is clear from characterization measurements and observations there is always a dispersity in size and shape of the final nanoparticle system. Even though microscopy is an excellent technique in capturing direct images of the nanoparticle morphology, it is difficult to assess the dispersity in size and shape of the nanostructure simply by observation of the microscopy data. This is why we propose a computer-assisted tool developed for the purpose of facilitated nanoparticle detection and its morphology identification.
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