{"title":"外部电磁对复杂电子设备的影响建模","authors":"S. Chermoshencev, R. Gaynutdinov","doi":"10.1109/SCM.2015.7190420","DOIUrl":null,"url":null,"abstract":"The paper discusses the electromagnetic topology technique for modeling by influence external electromagnetic field on the complex electronic equipment. In this paper we describe an example of modeling the influence of electromagnetic impulse on the complex electronic equipment.","PeriodicalId":106868,"journal":{"name":"2015 XVIII International Conference on Soft Computing and Measurements (SCM)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"Modeling the external electromagnetic influences on the complex electronic equipment\",\"authors\":\"S. Chermoshencev, R. Gaynutdinov\",\"doi\":\"10.1109/SCM.2015.7190420\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper discusses the electromagnetic topology technique for modeling by influence external electromagnetic field on the complex electronic equipment. In this paper we describe an example of modeling the influence of electromagnetic impulse on the complex electronic equipment.\",\"PeriodicalId\":106868,\"journal\":{\"name\":\"2015 XVIII International Conference on Soft Computing and Measurements (SCM)\",\"volume\":\"83 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 XVIII International Conference on Soft Computing and Measurements (SCM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SCM.2015.7190420\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 XVIII International Conference on Soft Computing and Measurements (SCM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SCM.2015.7190420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling the external electromagnetic influences on the complex electronic equipment
The paper discusses the electromagnetic topology technique for modeling by influence external electromagnetic field on the complex electronic equipment. In this paper we describe an example of modeling the influence of electromagnetic impulse on the complex electronic equipment.