基于表面化学的纳米半导体缺陷工程

E. Seebauer
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引用次数: 0

摘要

就像气体从上面与表面发生反应一样,像间隙原子和空位这样的体点缺陷也可以从下面发生反应。很少有人注意到这种形式的表面化学,尽管它对纳米级半导体器件非常重要,其中所有区域都靠近表面或界面。我们实验室最近的固态扩散测量和建模表明,缺陷和半导体表面之间的反应可以在调节缺陷浓度方面发挥主导作用。此外,这些反应的速率可以通过亚单层气体吸附来控制。有两种不同的机制可以使用表面来控制整体缺陷浓度。第一种机制涉及从表面反射带电缺陷,这是由于电活性表面缺陷建立了一个排斥电场。第二种机制涉及缺陷与表面悬空键的交换。综上所述,这些观察结果指出了控制和操纵半导体纳米结构制造中的缺陷的全新可能性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Defect Engineering in Nanoscale Semiconductors through Surface Chemistry
In the same way that gases react with surfaces from above, bulk point defects such as interstitial atoms and vacancies can react from below. Little attention has been paid to this form of surface chemistry, although it is very important for nanoscale semiconductor devices where all regions are in close proximity to a surface or interface. Recent solid-state diffusion measurements and modeling in our laboratory have shown that reactions between defects and semiconductor surfaces can play the dominant role in regulating defect concentrations. Furthermore, the rates of these reactions can be controlled through submonolayer gas adsorption. There are two separate mechanisms for using the surface to control bulk defect concentrations. The first mechanism involves reflecting charged defects from the surface due to electrically active surface defects that set up a repulsive electric field. The second mechanism involves the exchange of defects with surface dangling bonds. Taken together, these observations point to entirely new possibilities for controlling and manipulating defects in semiconductor nanostructure fabrication.
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