{"title":"不完全m-out- n码的自检检查器设计","authors":"N. Butorina","doi":"10.1109/EWDTS.2014.7027072","DOIUrl":null,"url":null,"abstract":"This paper presents the synthesis of self-testing checker (STC) for a subset of l codewords of m-out-of-n code. We consider FPGA realization of the checker.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Self-testing checker design for incomplete m-out-of-n codes\",\"authors\":\"N. Butorina\",\"doi\":\"10.1109/EWDTS.2014.7027072\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the synthesis of self-testing checker (STC) for a subset of l codewords of m-out-of-n code. We consider FPGA realization of the checker.\",\"PeriodicalId\":272780,\"journal\":{\"name\":\"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EWDTS.2014.7027072\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2014.7027072","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Self-testing checker design for incomplete m-out-of-n codes
This paper presents the synthesis of self-testing checker (STC) for a subset of l codewords of m-out-of-n code. We consider FPGA realization of the checker.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
