基于二阶CDAC的45nm CMOS分数阶杂散抵消的7.7~10.3GHz 5.2mW -247.3dB-FOM分数阶n参考采样锁相环

Dongyi Liao, F. Dai
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引用次数: 2

摘要

本文提出了一种分数阶N参考采样锁相环(RSPLL)。为了减轻fracn引起的量化误差,在参考采样鉴相器(RSPD)输出端实现了基于电容数模转换器(CDAC)的消去器。RSPD被编程为提供一个VCO周期的检测范围,足以覆盖fracn模式下的量化误差。CDAC也被重用为RSPD的采样电容。此外,采用一个电容阵列和两个参考电压的二阶抵消方案来补偿RSPD的非线性。该原型芯片采用45纳米部分耗尽绝缘体上硅(PDSOI) CMOS工艺制造。测量结果表明,输出频率范围为7.7~10.3GHz,综合抖动(10kHz-10MHz)为190fs,偏移频率为625kHz时,带内分数杂散电平为56dbc。整个锁相环功耗为5.2mW, FoM为-247.3dB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 7.7~10.3GHz 5.2mW -247.3dB-FOM Fractional-N Reference Sampling PLL with 2nd Order CDAC Based Fractional Spur Cancellation In 45nm CMOS
In this paper, a fractional- N reference sampling PLL (RSPLL) is presented. To mitigate the frac-N induced quantization error, a capacitor digital-to-analog converter (CDAC) based canceller has been implemented at the reference sampling phase detector (RSPD) output. The RSPD is programmed to provide a detection range of one VCO cycle which is enough to cover the quantization error in frac-N mode. The CDAC is also reused as the sampling capacitor for RSPD. Additionally, a second order cancellation scheme is implemented with only one capacitor array and two reference voltages to compensate for the nonlinearity from RSPD. The prototype chip was fabricated in a 45 nm partially-depleted silicon-on-insulator (PDSOI) CMOS process. Measurement showed an output frequency range covering 7.7~10.3GHz with an integrated jitter (10kHz-10MHz) of 190fs and an in-band fractional spur level of-56dBc at an offset frequency of 625kHz. The entire PLL consumes 5.2mW and achieves a FoM of -247.3dB.
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