用于运动物体表面轮廓测量的三维成像系统

Fuqin Deng, Jianyang Liu, Jiangwen Deng, Kenneth S. M. Fung, E. Lam
{"title":"用于运动物体表面轮廓测量的三维成像系统","authors":"Fuqin Deng, Jianyang Liu, Jiangwen Deng, Kenneth S. M. Fung, E. Lam","doi":"10.1109/IST.2013.6729718","DOIUrl":null,"url":null,"abstract":"Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently.","PeriodicalId":448698,"journal":{"name":"2013 IEEE International Conference on Imaging Systems and Techniques (IST)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"A three-dimensional imaging system for surface profilometry of moving objects\",\"authors\":\"Fuqin Deng, Jianyang Liu, Jiangwen Deng, Kenneth S. M. Fung, E. Lam\",\"doi\":\"10.1109/IST.2013.6729718\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently.\",\"PeriodicalId\":448698,\"journal\":{\"name\":\"2013 IEEE International Conference on Imaging Systems and Techniques (IST)\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Conference on Imaging Systems and Techniques (IST)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IST.2013.6729718\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference on Imaging Systems and Techniques (IST)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IST.2013.6729718","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

非接触式光学成像系统的设计和相应的表面轮廓测量算法是各种计量应用中的关键组成部分,例如生产线上半导体元件的表面检测。对于这种具有挑战性的工业应用,最重要的考虑因素通常是检测的自动化,精度和速度。在这项工作中,我们提出了一个数学框架和动态相移算法(D-PSA),用于移动物体的密集表面轮廓测量。我们还提出了一种带有投影仪和相机阵列的条纹图案投影系统,目的是利用大视场检测系统减少对重建表面的不均匀照明和透视几何效应等不良影响。然后将该系统应用于沿传送带移动的印刷电路板表面的检查。实验结果表明,该方法可以有效地重建物体表面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A three-dimensional imaging system for surface profilometry of moving objects
Non-contact optical imaging system design and the corresponding surface profilometry algorithm are critical components in various metrology applications, such as surface inspection of semiconductor components on the production line. For such challenging industrial applications, the most important considerations are often automation, precision and speed of the inspection. In this work, we propose a mathematical framework and a dynamic phase-shift algorithm (D-PSA) for a dense surface profilometry of moving objects. We also present a fringe pattern projection system with projector and camera arrays, with an aim to reduce the undesirable effects such as the uneven illumination and the perspective geometry effect on the reconstructed surface using a large field-of-view inspection system. This system is then applied to the inspection of the surface of moving printed circuit boards along a conveyor belt. Experimental results show that our approach can reconstruct the object surface effectively and efficiently.
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