{"title":"模拟有源RC滤波器自检自标定系统的设计","authors":"Leonid Kladovscikov, R. Navickas","doi":"10.1109/AIEEE.2017.8270545","DOIUrl":null,"url":null,"abstract":"Integrated circuit fabrication technological processes affect error of transceiver's parameters. Such deviation of parameters are meant to be estimated and tuned up to desired. This paper describes self-test and self-calibration systems of active RC low pass filters. Main parameters to be estimated and tuned are cut-off frequency, gain and band-pass linearity. Self-calibration system is designed in 0.18 μm technology node, with 1.8 V supply voltage for 10 MHz application. Designed self-calibration system tuning accuracy varies from 0.8 % to 1 %.","PeriodicalId":224275,"journal":{"name":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Design of self-test and self-calibration systems for analog active RC filters\",\"authors\":\"Leonid Kladovscikov, R. Navickas\",\"doi\":\"10.1109/AIEEE.2017.8270545\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Integrated circuit fabrication technological processes affect error of transceiver's parameters. Such deviation of parameters are meant to be estimated and tuned up to desired. This paper describes self-test and self-calibration systems of active RC low pass filters. Main parameters to be estimated and tuned are cut-off frequency, gain and band-pass linearity. Self-calibration system is designed in 0.18 μm technology node, with 1.8 V supply voltage for 10 MHz application. Designed self-calibration system tuning accuracy varies from 0.8 % to 1 %.\",\"PeriodicalId\":224275,\"journal\":{\"name\":\"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIEEE.2017.8270545\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIEEE.2017.8270545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of self-test and self-calibration systems for analog active RC filters
Integrated circuit fabrication technological processes affect error of transceiver's parameters. Such deviation of parameters are meant to be estimated and tuned up to desired. This paper describes self-test and self-calibration systems of active RC low pass filters. Main parameters to be estimated and tuned are cut-off frequency, gain and band-pass linearity. Self-calibration system is designed in 0.18 μm technology node, with 1.8 V supply voltage for 10 MHz application. Designed self-calibration system tuning accuracy varies from 0.8 % to 1 %.