测量亚微米尺度的动态现象

2008 International Conference on Nanoscience and Nanotechnology Pub Date : 2008-10-07 DOI:10.1109/ICONN.2008.4639263

J. Soria, O. Amili, C. Atkinson

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引用次数: 4

摘要

由于光学系统的衍射极限，在亚微米水平上测量动态现象的时空演化是非平凡的。本文描述了一种技术，该技术允许对基于流体的现象的亚微米特征进行成像，特别是确定其速度和轨迹。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measuring dynamic phenomena at the sub-micron scale

Measuring the spatio-temporal evolution of dynamic phenomena at sub-micron level is non-trivial due to the diffraction limit of optical systems. This paper describes a technique which allows imaging of sub-micron features of fluid-based phenomena, specifically the determination of their velocity and trajectory.

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2008 International Conference on Nanoscience and Nanotechnology

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