{"title":"LED系统可靠性","authors":"W. V. van Driel, C. Yuan, S. Koh, G.Q. Zhang","doi":"10.1109/ESIME.2011.5765848","DOIUrl":null,"url":null,"abstract":"This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.","PeriodicalId":115489,"journal":{"name":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"41","resultStr":"{\"title\":\"LED system reliability\",\"authors\":\"W. V. van Driel, C. Yuan, S. Koh, G.Q. Zhang\",\"doi\":\"10.1109/ESIME.2011.5765848\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.\",\"PeriodicalId\":115489,\"journal\":{\"name\":\"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-04-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"41\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2011.5765848\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2011.5765848","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents our effort to predict the system reliability of Solid State Lighting (SSL) applications. A SSL system is composed of a LED engine with micro-electronic driver(s) that supplies power to the optic design. Knowledge of system level reliability is not only a challenging scientific exercise but it is also crucial for successful adoption of future SSL systems. Currently, the lifetime of a SSL system provided by the manufacturers is often based on just the life time of the LED emitter but a malfunction of the system in reality is often induced by the failure or degradation of a combination of subsystems/interfaces. Hence, a significant improvement in the future SSL system can be achieved when the system level reliability is well understood by proper experimental and simulation techniques.