用计算机控制装置测量阻抗

2018 IEEE XXVII International Scientific Conference Electronics - ET Pub Date : 2018-09-01 DOI:10.1109/ET.2018.8549594

I. Zhivkov, Ivan Todorov, Michal Hrabal, R. Yordanov, M. Vala

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引用次数: 0

摘要

建立了基于AD5933芯片的阻抗测量系统，并对控制样品和交流电致发光结构进行了测试。结果发现，测量时间不受MCLK的限制，而是取决于激励频率的周期，在AD5933的数字模块中进行处理。所进行的测量与控制阻抗分析仪的数据吻合良好。

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Measurement of Impedance with Computer Controlled Setup

Setup for impedance measurement based on AD5933 chip was accomplished and tested with measurement of control samples and AC electroluminescent structures. It was found that the time of the measurement is not limited by MCLK but depends on the period of the excitation frequency, which is processed in the digital modules of AD5933. The measurement performed is in a good agreement with data taken from control impedance analyzer.

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2018 IEEE XXVII International Scientific Conference Electronics - ET

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