Akiko Hisasue, J. Tateishi, T. Yamano, A. Shigetomi
{"title":"基于生产控制系统的具有预估数量功能的物料管理系统","authors":"Akiko Hisasue, J. Tateishi, T. Yamano, A. Shigetomi","doi":"10.1109/ISSM.2001.962922","DOIUrl":null,"url":null,"abstract":"This report describes a material management system with a function of estimated number based on MES. It is difficult to ensure adequate quantity of the required stock for each material in a development fabrication, because of the change of process flow and materials. Using the method of estimated number which utilizes the number of wafers which will be used in a production control system, we have been able to ensure adequate quantity of the required stock for each material and take measures for logistics or cost reduction.","PeriodicalId":356225,"journal":{"name":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Material management system with the function of estimated number based on production control system\",\"authors\":\"Akiko Hisasue, J. Tateishi, T. Yamano, A. Shigetomi\",\"doi\":\"10.1109/ISSM.2001.962922\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This report describes a material management system with a function of estimated number based on MES. It is difficult to ensure adequate quantity of the required stock for each material in a development fabrication, because of the change of process flow and materials. Using the method of estimated number which utilizes the number of wafers which will be used in a production control system, we have been able to ensure adequate quantity of the required stock for each material and take measures for logistics or cost reduction.\",\"PeriodicalId\":356225,\"journal\":{\"name\":\"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSM.2001.962922\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSM.2001.962922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Material management system with the function of estimated number based on production control system
This report describes a material management system with a function of estimated number based on MES. It is difficult to ensure adequate quantity of the required stock for each material in a development fabrication, because of the change of process flow and materials. Using the method of estimated number which utilizes the number of wafers which will be used in a production control system, we have been able to ensure adequate quantity of the required stock for each material and take measures for logistics or cost reduction.