半导体制造设备数据采集仿真时序性能分析

Y. Li-Baboud, Xiao Zhu, D. Anand, Safiullah Hussaini, J. Moyne
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引用次数: 7

摘要

获取高质量设备和过程数据的能力对于未来的实时过程控制系统非常重要,以最大限度地提高半导体制造良率和设备效率。用于精确时间戳的时钟同步和在跟踪数据收集中保持一致的频率对于准确合并来自异构数据源的数据至关重要。为了描述影响数据采集同步和性能的因素,开发了一个可配置的全晶圆厂设备数据采集(EDA)模拟器。通过了解影响时钟同步和精确时间戳的因素,该模拟器用于识别和探索减轻延迟的方法,并为设备数据采集系统的精确时间戳提供指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Semiconductor manufacturing equipment data acquisition simulation for timing performance analysis
The ability to acquire quality equipment and process data is important for future real-time process control systems to maximize opportunities for semiconductor manufacturing yield enhancement and equipment efficiency. Clock synchronization for accurate time-stamping and maintaining a consistent frequency in trace data collection are essential for accurate merging of data from heterogeneous sources. To characterize the factors impacting data collection synchronization and performance, a configurable fab-wide equipment data acquisition (EDA) simulator has been developed. By understanding the factors impacting clock synchronization and accurate time-stamping, the simulator is used to identify and explore methods to mitigate the latencies and provide guidance on accurate time-stamping for equipment data acquisition systems.
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