A. V. Wagner, R. Foreman, L. Summers, T. Barbee, J. Farmer
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Fabrication and testing of thermoelectric thin film devices
Two thin-film thermoelectric devices are experimentally demonstrated. The relevant thermal loads on the cold junction of these devices are determined. The analytical form of the equation that describes the thermal loading of the device enables us to model the performance based on the independently measured electronic properties of the films forming the devices. This model elucidates which parameters determine device performance, and how they can be used to maximize performance.