{"title":"多频电容电压表征系统","authors":"G. Nikolov, I. Ruskova, E. Gieva, B. Nikolova","doi":"10.1109/ET.2017.8124373","DOIUrl":null,"url":null,"abstract":"Capacitance measurement at different DC voltage levels, different signal amplitudes and different frequencies, finds extensive application to qualify semiconductor and multiple-layered structures. Generally, the cost of such type instrumentation is in range of several thousand dollars and they are not very popular in the market. In present paper an approach of combining conventional measuring instruments and high-level programming environment is suggested in order to achieve system with complete functionalities for capacitance measurements.","PeriodicalId":127983,"journal":{"name":"2017 XXVI International Scientific Conference Electronics (ET)","volume":"195 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"System for multi-frequency capacitance-voltage characterization\",\"authors\":\"G. Nikolov, I. Ruskova, E. Gieva, B. Nikolova\",\"doi\":\"10.1109/ET.2017.8124373\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Capacitance measurement at different DC voltage levels, different signal amplitudes and different frequencies, finds extensive application to qualify semiconductor and multiple-layered structures. Generally, the cost of such type instrumentation is in range of several thousand dollars and they are not very popular in the market. In present paper an approach of combining conventional measuring instruments and high-level programming environment is suggested in order to achieve system with complete functionalities for capacitance measurements.\",\"PeriodicalId\":127983,\"journal\":{\"name\":\"2017 XXVI International Scientific Conference Electronics (ET)\",\"volume\":\"195 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 XXVI International Scientific Conference Electronics (ET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ET.2017.8124373\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 XXVI International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET.2017.8124373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
System for multi-frequency capacitance-voltage characterization
Capacitance measurement at different DC voltage levels, different signal amplitudes and different frequencies, finds extensive application to qualify semiconductor and multiple-layered structures. Generally, the cost of such type instrumentation is in range of several thousand dollars and they are not very popular in the market. In present paper an approach of combining conventional measuring instruments and high-level programming environment is suggested in order to achieve system with complete functionalities for capacitance measurements.
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