{"title":"毫米波光子学仪器与测量研究进展","authors":"T. Nagatsuma","doi":"10.1109/MWP.1999.819659","DOIUrl":null,"url":null,"abstract":"This paper will review the latest of several instrumentation and measurement technologies in millimeter-wave photonics, especially using 1.3/1.55-/spl mu/m-wavelength-based techniques. Progress of key technology and state-of-the-art system applications will be described.","PeriodicalId":176577,"journal":{"name":"International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"19","resultStr":"{\"title\":\"Progress of instrumentation and measurement toward millimeter-wave photonics\",\"authors\":\"T. Nagatsuma\",\"doi\":\"10.1109/MWP.1999.819659\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper will review the latest of several instrumentation and measurement technologies in millimeter-wave photonics, especially using 1.3/1.55-/spl mu/m-wavelength-based techniques. Progress of key technology and state-of-the-art system applications will be described.\",\"PeriodicalId\":176577,\"journal\":{\"name\":\"International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"19\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWP.1999.819659\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Topical Meeting on Microwave Photonics. MWP'99. Technical Digest (Cat. No.99EX301)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWP.1999.819659","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Progress of instrumentation and measurement toward millimeter-wave photonics
This paper will review the latest of several instrumentation and measurement technologies in millimeter-wave photonics, especially using 1.3/1.55-/spl mu/m-wavelength-based techniques. Progress of key technology and state-of-the-art system applications will be described.