{"title":"关于特征选择对图像理解的挑战的说明","authors":"Thomas B. Kinsman, J. Pelz","doi":"10.1109/WNYIPW.2013.6890984","DOIUrl":null,"url":null,"abstract":"It is well known that using the correct features for pattern recognition is far more important than using a sophisticated classifier. A high order classifier, given inadequate features, will produce poor results. Low-level formed are combined to form mid-level features, which have much more discriminating power. Yet, the challenge of feature selection is often neglected in the literature. The literature often assumes that given N low-level features there are 2N-1 ways to use them, which significantly understates the challenge of finding the best features to use and the best ways to combine them. Basic low-level features (input measurements) must be combined in groups to construct features that are relevant for object recognition [1], yet the computational complexity of grouping measurements for input to a pattern recognition system makes the task very difficult. This paper discusses a method for quantifying the total number of ways to group a given number of low-level features for better understanding the feature selection problem.","PeriodicalId":408297,"journal":{"name":"2013 IEEE Western New York Image Processing Workshop (WNYIPW)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A note on the challenge of feature selection for image understanding\",\"authors\":\"Thomas B. Kinsman, J. Pelz\",\"doi\":\"10.1109/WNYIPW.2013.6890984\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is well known that using the correct features for pattern recognition is far more important than using a sophisticated classifier. A high order classifier, given inadequate features, will produce poor results. Low-level formed are combined to form mid-level features, which have much more discriminating power. Yet, the challenge of feature selection is often neglected in the literature. The literature often assumes that given N low-level features there are 2N-1 ways to use them, which significantly understates the challenge of finding the best features to use and the best ways to combine them. Basic low-level features (input measurements) must be combined in groups to construct features that are relevant for object recognition [1], yet the computational complexity of grouping measurements for input to a pattern recognition system makes the task very difficult. This paper discusses a method for quantifying the total number of ways to group a given number of low-level features for better understanding the feature selection problem.\",\"PeriodicalId\":408297,\"journal\":{\"name\":\"2013 IEEE Western New York Image Processing Workshop (WNYIPW)\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE Western New York Image Processing Workshop (WNYIPW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WNYIPW.2013.6890984\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE Western New York Image Processing Workshop (WNYIPW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WNYIPW.2013.6890984","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A note on the challenge of feature selection for image understanding
It is well known that using the correct features for pattern recognition is far more important than using a sophisticated classifier. A high order classifier, given inadequate features, will produce poor results. Low-level formed are combined to form mid-level features, which have much more discriminating power. Yet, the challenge of feature selection is often neglected in the literature. The literature often assumes that given N low-level features there are 2N-1 ways to use them, which significantly understates the challenge of finding the best features to use and the best ways to combine them. Basic low-level features (input measurements) must be combined in groups to construct features that are relevant for object recognition [1], yet the computational complexity of grouping measurements for input to a pattern recognition system makes the task very difficult. This paper discusses a method for quantifying the total number of ways to group a given number of low-level features for better understanding the feature selection problem.